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Bias Temperature Instability for Devices and Circuits (Reprint) (Paperback)

Bias Temperature Instability for Devices and Circuits (Reprint) (Paperback) - image 1 of 1

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This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias temperature instability. Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, anomalous defect behavior, stochastic modeling with additional metastable states, multiphonon theory, compact modeling with RC ladders and implications on device reliability and lifetime.
Edition: Reprint
Genre: Technology
Format: Paperback
Publisher: Springer Verlag
Language: English
Street Date: August 26, 2016
TCIN: 51536961
UPC: 9781493955299
Item Number (DPCI): 248-26-1348

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