Electrical and information engineers explore the effects of ionizing radiation on modern semiconductor devices and solutions for hardening the devices. They include background material, case studies, and references for the benefit of readers new to the field of ionizing radiation. Their topics include Monte Carlo simulations of radiation effects, radiation effects in flash memories, single-event mitigation techniques for analog and mixed-signal circuits, radiation effects on complementary metal-oxide semiconductor active pixel sensors, and radiation effects on optical fibers and fiber-based sensors. Annotation ©2016 Ringgold, Inc., Portland, OR (protoview.com)
This book provides a wide perspective on the effects of ionizing radiation in modern semiconductor devices, addressing a wide range of electronic devices and several environments of interest: terrestrial, space, and high-energy physics experiments. It introduces radiation effects and the underlying basic mechanisms. It provides real examples and case studies to assess radiation effects issues in a wide range of electronic devices.
Number of Pages: 391
Sub-Genre: Engineering / Mechanical, Electronics / Circuits / General
Series Title: Devices, Circuits, and Systems
Publisher: Taylor & Francis
Street Date: November 3, 2015
Item Number (DPCI): 247-50-8120