:

product description page

Nanocharacterisation (Hardcover)

Nanocharacterisation (Hardcover) - image 1 of 1

About this item

Editors Kirkland and Haigh offer the second edition of this nanocharacterisation compilation, revised and updated to incorporate new advances in the field of nanomaterials and their analysis. The first two chapters thoroughly cover the seminal analytic method of transmission electron microscopy (TEM) and its derivative, scanning transmission electron microscopy (STEM). The third chapter introduces scanning tunneling microscopy (STM) in the context of surfaces and nanostructures. Chapter 4 builds up these techniques with electron energy loss spectroscopy (EELS) and energy dispersive X-ray (EDX) analysis and how they can be used in the electron microscope. The 3-dimensional shape-determining techniques of electron holography and tomography are discussed before ending with a contribution on scanning electron microscopy (SEM) and its novel extension into helium ion microscopy. With each contribution, the indications and limitations of each technique for elucidating chemical and physical properties are described and the consequences for data analysis are discussed. Distributed in the US by Ingram Publisher Services. Annotation ©2016 Ringgold, Inc., Portland, OR (protoview.com)

Nanocharacterisation provides an overview of the main characterisation techniques that are currently used to study nanostructured materials. Following on from the success of the first edition, this new edition has been fully revised and updated to reflect the recent developments in instrumental characterisation methods.

With contributions from internationally recognised experts, each chapter focuses on a different technique to characterise nanomaterials providing experimental procedures and applications. State of the art characterisation methods covered include Transmission Electron Microscopy, Scanning Transmission Electron Microscopy, Scanning Probe Microscopy, Electron Energy Loss Spectroscopy and Energy Dispersive X-ray Analysis, 3D Characterisation, Scanning Electron and Ion Microscopy and In situ Microscopy.

Essentially a handbook to all working in the field this indispensable resource will appeal to academics, professionals and anyone working fields related to the research and development of nanocharacterisation and nanotechnology.

Number of Pages: 358
Genre: Technology
Sub-Genre: Nanotechnology
Series Title: Rsc Nanoscience & Nanotechnology
Format: Hardcover
Publisher: Royal Society of Chemistry
Language: English
Street Date: August 24, 2015
TCIN: 15924794
UPC: 9781849738057
Item Number (DPCI): 248-94-8037
If the item details above aren’t accurate or complete, we want to know about it. Report incorrect product info.

Guest reviews

Prices, promotions, styles and availability may vary by store & online. See our price match guarantee. See how a store is chosen for you.