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Reliability Investigation of Led Devices for Public Light Applications (Hardcover) (Raphael Baillot &

Reliability Investigation of Led Devices for Public Light Applications (Hardcover) (Raphael Baillot & - image 1 of 1

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Reliability Investigation of LED Devices for Public Light Applications, based on the work of two main Phd dissertations in 2011 and 2014, describes state-of-the-art GaN technology focusing on the specific electrical and spectral model which is proposed in the second chapter. The authors study the typical failure mechanisms on public lighting applications. The last chapter deals with the degradation and robustness of the automotive applications.

This unique research proposes the technology and methodologies to understand failure mechanisms, exposing the physical and chemical analyses.

  • Based on the work of two main Phd results in 2011 and 2014
  • Describes GaN technology in the state-of-the-art, focusing on the specific electrical and spectral model
  • Proposes the technology and methodologies to understand failure mechanisms
Number of Pages: 222
Genre: Technology
Format: Hardcover
Publisher: Elsevier Science Ltd
Author: Raphael Baillot & Yannick Deshayes & Yves Ousten
Language: English
Street Date: March 6, 2017
TCIN: 51895423
UPC: 9781785481499
Item Number (DPCI): 248-36-8391
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$76.90
MSRPReg: $80.95 Save $4.05 (5% off)
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