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Reliability, Robustness and Failure Mechanisms of Led Devices : Methodology and Evaluation (Hardcover)

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Reliability, Robustness and Failure Mechanisms of LED Devices: Methodology and Evaluation presents several methods to determine the reliability of infrared LEDs. The book focuses on the method to extract fundamental parameters from electrical and optical characterizations. The authors identify different parameters related to specific zones in components and then extract failure mechanisms based on measured performance-before and after aging tests. The knowledge of failure mechanisms allows you to extract degradation laws related to a physics equation so an accurate lifetime distribution can then be proposed.

  • Deals exclusively with reliability, based on the physics of failure for infrared LEDs
  • Identifies failure mechanisms, lifetime distribution, and selection of the best component for dedicated applications
  • Uses a complete methodology to reduce the number of samples needed to estimate lifetime distribution
  • Focuses on the method to extract fundamental parameters from electrical and optical characterizations
Number of Pages: 200.0
Genre: Technology
Format: Hardcover
Publisher: Elsevier Science Ltd
Author: Yannick Deshayes & Laurent Bechou
Language: English
Street Date: September 26, 2016
TCIN: 52261295
UPC: 9781785481529
Item Number (DPCI): 248-44-6485

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