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Structural, Syntactic, and Statistical Pattern Recognition : Joint Iapr International Workshop, S+sspr

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About this item

This book constitutes the proceedings of the Joint IAPR International Workshop on Structural Syntactic, and Statistical Pattern Recognition, S+SSPR 2016, consisting of the International Workshop on Structural and Syntactic Pattern Recognition SSPR, and the International Workshop on Statistical Techniques in Pattern Recognition, SPR. The 51 full papers presented were carefully reviewed and selected from 68 submissions. They are organized in the following topical sections: dimensionality reduction, manifold learning and embedding methods; dissimilarity representations; graph-theoretic methods; model selection, classification and clustering; semi and fully supervised learning methods; shape analysis; spatio-temporal pattern recognition; structural matching; text and document analysis. 

Genre: Computers + Internet
Series Title: Image Processing, Computer Vision, Pattern Recognition, and Graphics
Format: Paperback
Publisher: Springer-Verlag New York Inc
Language: English
Street Date: December 7, 2016
TCIN: 51969892
UPC: 9783319490540
Item Number (DPCI): 248-37-6989
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