About this item
Terahertz time-domain spectroscopy (THz-TDS) is a unique technique for characterizing the response of materials and devices in the far-infrared region of the electromagnetic spectrum. Based on the measurement of transmitted or reflected ultra-short electromagnetic pulses and on a Fourier-transform of the recorded waveforms, THz-TDS permits fast and precise determination of the permittivity or permeability of materials over a wide bandwidth. This book is devoted to the determination of this spectral response of samples from the recorded waveforms.
The book presents the basics of THz-TDS, including latest and interesting research on THz domain. It overviews the main classical far-infrared techniques and describes a variety of THz-TDS setups. It provides a comprehensive overview of the extraction procedures that are used to calculate the permittivity (i.e., the complex refractive index) or permeability spectral curves from recorded waveforms. It addresses the main THz-TDS practical cases: transmission, reflection, attenuated total reflection, polarimetry, ellipsometry, pump-and-probe, scattering, thin films, metamaterials, plasmonics, etc+. It gives a detailed analysis of noise and uncertainties in THz-TDS. Finally, it compares THz-TDS with continuous wave THz spectroscopy and Raman spectroscopy techniques.