product description page

Theoretical Concepts of X-ray Nanoscale Analysis : Theory and Applications (Reprint) (Paperback) (Andrei

Theoretical Concepts of X-ray Nanoscale Analysis : Theory and Applications (Reprint) (Paperback) (Andrei - image 1 of 1

About this item

This book provides a concise survey of modern theoretical concepts of X-ray materials analysis. The principle features of the book are: basics of X-ray scattering, interaction between X-rays and matter and new theoretical concepts of X-ray scattering. The various X-ray techniques are considered in detail: high-resolution X-ray diffraction, X-ray reflectivity, grazing-incidence small-angle X-ray scattering and X-ray residual stress analysis. All the theoretical methods presented use the unified physical approach. This makes the book especially useful for readers learning and performing data analysis with different techniques. The theory is applicable to studies of bulk materials of all kinds, including single crystals and polycrystals as well as to surface studies under grazing incidence. The book appeals to researchers and graduate students alike.
Edition: Reprint
Genre: Science, Technology
Series Title: Springer Series in Materials Science
Format: Paperback
Publisher: Springer Verlag
Author: Andrei Benediktovitch
Language: English
Street Date: September 16, 2016
TCIN: 51717859
UPC: 9783662520543
Item Number (DPCI): 248-33-2819
If the item details above aren’t accurate or complete, we want to know about it. Report incorrect product info.

Guest reviews

Prices, promotions, styles and availability may vary by store & online. See our price match guarantee. See how a store is chosen for you.