Surface Analysis - 2nd Edition by John C Vickerman & Ian S Gilmore (Paperback)

Book Synopsis

Die Theorie und Praxis der Oberflächenanalyse wird von Experten mehrerer Fachgebiete erläutert. Dadurch wird der Leser in die Lage versetzt, Ergebnisse und Datenreihen zu verstehen und umzusetzen.

From the Back Cover

The second edition of this successful textbook provides a clear, well-written introduction to the principal techniques used in surface analysis, together with the computational methods used to interpret the increasingly complex data generated by them. Coverage includes the basic theory and practice of each technique together with practical examples of its sue and application and most chapters include review questions enabling the reader to develop and test their understanding.

Includes the following new material:

• A completely new chapter on 'Dynamic SIMS'
• A completely new chapter on 'The Application of Multivariate Data Analysis Techniques in Surface Analysis'
• All the other chapters have been extensively revised. Many now include illustrative applications and development room the fields of biotechnology and nanotechnology.

Surface Analysis: the Principal Techniques 2nd Edition, will be appropriate for the scientifically literate lay-person and for use in specialist undergraduate courses in materials and analytical sciences. Post-graduate M.Sc. and Ph.D. students involved in surface analysis and research whether concerned with inorganic, organic or biological materials will find it particularly useful. In addition, industrial analytical scientists will find this book an invaluable introduction to bring rapid familiarity with the capabilities of the various techniques.

Thus this book should be of value to those who need to have a wide overview of the techniques in education or in industrial quality control or R&D laboratories. For those who wish to further develop their knowledge and practice or particular techniques, it should also give a good basic understanding from which to build.

About the Author

John C. Vickerman BSc in Chemistry (Edinburgh), Ph.D. in Surface Chemistry (Bristol), DSc (Bristol). Predoctoral fellowships at the Universities of Perugia and Rome, postdoctoral fellowships at the University of Bristol and the Technical University of Eindhoven. Sabbatical study periods at the University of Munich, the Free University of Berlin and Pennsylvania State University.

Dr Ian Gilmore, Surface and Nano-Analysis, National Physical Laboratory, Teddington, UK
Ian is a Principal Research Scientist in the Surface and Nano-Analysis Research team and joined NPL in 1991. His research has a focus on the analysis of complex molecules at surfaces. Recent research has led to the development of a novel new variant of static static SIMS called gentle-SIMS or G-SIMS,
He received a degree in Physics from the University of Manchester in 1991 and a PhD from the University of Loughborough in 2000. Ian is a Fellow of the Institute of Physics a member of the EPSRC College and a member of the American Vacuum Society.