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Scan Statistics - (Statistics for Industry and Technology) by Joseph Glaz & Vladimir Pozdnyakov & Sylvan Wallenstein (Hardcover)

Scan Statistics - (Statistics for Industry and Technology) by  Joseph Glaz & Vladimir Pozdnyakov & Sylvan Wallenstein (Hardcover) - 1 of 1
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About this item

Highlights

  • Scan statistics is currently one of the most active and important areas of research in applied probability and statistics, having applications to a wide variety of fields: archaeology, astronomy, bioinformatics, biosurveillance, molecular biology, genetics, computer science, electrical engineering, geography, material sciences, physics, reconnaissance, reliability and quality control, telecommunication, and epidemiology.
  • Author(s): Joseph Glaz & Vladimir Pozdnyakov & Sylvan Wallenstein
  • 394 Pages
  • Mathematics, Probability & Statistics
  • Series Name: Statistics for Industry and Technology

Description



About the Book



Filling a gap in the literature, this volume brings together a collection of selected chapters illustrating the depth and diversity of theory, methods and applications in the area of scan statistics. Key features include current results and new directions.



Book Synopsis



Scan statistics is currently one of the most active and important areas of research in applied probability and statistics, having applications to a wide variety of fields: archaeology, astronomy, bioinformatics, biosurveillance, molecular biology, genetics, computer science, electrical engineering, geography, material sciences, physics, reconnaissance, reliability and quality control, telecommunication, and epidemiology. Filling a gap in the literature, this self-contained volume brings together a collection of selected chapters illustrating the depth and diversity of theory, methods and applications in the area of scan statistics.



From the Back Cover



Scan statistics is currently one of the most active and important areas of research in applied probability and statistics, having applications to a wide variety of fields: archaeology, astronomy, bioinformatics, biosurveillance, molecular biology, genetics, computer science, electrical engineering, geography, material sciences, physics, reconnaissance, reliability and quality control, telecommunication, and epidemiology.

Filling a gap in the literature, this self-contained volume brings together a collection of selected chapters illustrating the depth and diversity of theory, methods and applications in the area of scan statistics.

Key features:


* Chapters are written by leading experts in the field.

* Features many current results and highlights new directions for future research.

* Includes challenging theoretical methodological research problems.

* Presentation is accessible to statisticians as well as to scientists from other disciplines where scan statistics are employed.

* Real-world applications to areas such as bioinformatics and biosurveillance are emphasized.

* Contains extensive references to research articles, books, and relevant computer software.

Scan Statistics is an excellent reference for graduate students and researchers in applied probability and statistics, as well as for scientists in biology, computer science, pharmaceutical science, medicine, geography, quality control, communications, and epidemiology. The work may also be used as a textbook for a graduate-level seminar on scan statistics.



Review Quotes




From the reviews:

"The area of scan statistics has developed rapidly in recent years. ... provided excellent overviews of the area. ... There are many papers of interest here for the readers of Technometrics. ... This reviewer enjoyed thumbing through the pages of this volume and feels that the editors hope that it will serve as a valuable reference and source for researchers in applied probability and statistics and in many other areas of science and technology is well justified." (H. N. Nagaraja, Technometrics, Vol. 53 (1), February, 2011)
Dimensions (Overall): 10.0 Inches (H) x 7.0 Inches (W) x .94 Inches (D)
Weight: 2.09 Pounds
Suggested Age: 22 Years and Up
Number of Pages: 394
Genre: Mathematics
Sub-Genre: Probability & Statistics
Series Title: Statistics for Industry and Technology
Publisher: Birkhauser
Theme: General
Format: Hardcover
Author: Joseph Glaz & Vladimir Pozdnyakov & Sylvan Wallenstein
Language: English
Street Date: May 28, 2009
TCIN: 1006476844
UPC: 9780817647483
Item Number (DPCI): 247-37-8454
Origin: Made in the USA or Imported
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Shipping details

Estimated ship dimensions: 0.94 inches length x 7 inches width x 10 inches height
Estimated ship weight: 2.09 pounds
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