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About this item
Highlights
- Semiconductor Memories provides in-depth coverage in the areas of design for testing, fault tolerance, failure modes and mechanisms, and screening and qualification methods including.
- About the Author: ASHOK K. SHARMA is the author of Semiconductor Memories: Technology, Testing, and Reliability.
- 480 Pages
- Technology, Electronics
Description
Book Synopsis
Semiconductor Memories provides in-depth coverage in the areas of design for testing, fault tolerance, failure modes and mechanisms, and screening and qualification methods including.* Memory cell structures and fabrication technologies.
* Application-specific memories and architectures.
* Memory design, fault modeling and test algorithms, limitations, and trade-offs.
* Space environment, radiation hardening process and design techniques, and radiation testing.
* Memory stacks and multichip modules for gigabyte storage.
Review Quotes
"...a valuable reference..." (Microelectronics Reliability, Vol. 43, 2003)
About the Author
ASHOK K. SHARMA is the author of Semiconductor Memories: Technology, Testing, and Reliability. He is currently working as a reliability engineering manager at NASA, Goddard Space Flight Center, Greenbelt, Maryland.
Dimensions (Overall): 10.27 Inches (H) x 7.29 Inches (W) x 1.17 Inches (D)
Weight: 2.34 Pounds
Suggested Age: 22 Years and Up
Number of Pages: 480
Genre: Technology
Sub-Genre: Electronics
Publisher: Wiley-IEEE Press
Theme: Semiconductors
Format: Hardcover
Author: Ashok K Sharma
Language: English
Street Date: September 10, 2002
TCIN: 1004109427
UPC: 9780780310001
Item Number (DPCI): 247-21-0451
Origin: Made in the USA or Imported
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Shipping details
Estimated ship dimensions: 1.17 inches length x 7.29 inches width x 10.27 inches height
Estimated ship weight: 2.34 pounds
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