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Atomic Layer Deposition 2e - 2nd Edition by Tommi Kääriäinen & David Cameron & Marja-Leena Kääriäinen & Arthur Sherman (Hardcover)

Atomic Layer Deposition 2e - 2nd Edition by  Tommi Kääriäinen & David Cameron & Marja-Leena Kääriäinen & Arthur Sherman (Hardcover) - 1 of 1
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About this item

Highlights

  • Since the first edition was published in 2008, Atomic Layer Deposition (ALD) has emerged as a powerful, and sometimes preferred, deposition technology.
  • About the Author: Tommi Kääriäinen is a researcher at the Advanced Surface Technology Research Laboratory (ASTRaL) in Lappeenranta University of Technology (LUT), Finland.
  • 272 Pages
  • Technology, Materials Science

Description



Book Synopsis



Since the first edition was published in 2008, Atomic Layer Deposition (ALD) has emerged as a powerful, and sometimes preferred, deposition technology. The new edition of this groundbreaking monograph is the first text to review the subject of ALD comprehensively from a practical perspective. It covers ALD's application to microelectronics (MEMS) and nanotechnology; many important new and emerging applications; thermal processes for ALD growth of nanometer thick films of semiconductors, oxides, metals and nitrides; and the formation of organic and hybrid materials.



From the Back Cover



This is the first practical ALD book which goes extensively into applications as well as the foundations of theory, including fundamental aspects such as films and materials.

Atomic Layer Deposition: Principles, Characteristics, and Nanotechnology Applications is a new edition of Atomic Layer Deposition for Nanotechnology, authored by Arthur Sherman and published in 2008. The new edition has been thoroughly updated to cover new developments in process configuration, such as roll-to-roll manufacturing, and has been extended to highlight industrial applications.

ALD technology is being adopted by manufacturers all over the world, making Atomic Layer Deposition: Principles, Characteristics, and Nanotechnology Applications an indispensable title. ALD has become of paramount importance in a number of applications in recent years. This is particularly true for microelectronics and MEMS devices because of the economic pressure driving devices to ever smaller dimensions. Non-microelectronics applications, where the characteristic uniformity and conformality properties of ALD are prized, have gained great potential as well. In particular, emerging industrial applications such as organic and flexible electronics, solar cells, optical coatings, silver tarnish prevention, coating catalytic membranes, and solid fuel cells are the most notable.

Readership
Scientists and engineers in diverse fields of chemistry, materials science and physics who develop the ultra-thin film deposition processes and manufacturing technology facilitating industrial applications. Atomic Layer Deposition is highly suitable for use in training in the industrial setting as well as for a graduate-level course in atomic layer deposition.



About the Author



Tommi Kääriäinen is a researcher at the Advanced Surface Technology Research Laboratory (ASTRaL) in Lappeenranta University of Technology (LUT), Finland. He has over nine years of experience in thin film deposition and analytical techniques. He has especially focused on atomic layer deposition (ALD) at low temperatures and recently on spatial and roll-to-roll ALD.

David Cameron received his BSc in electrical and electronic engineering from the University of Glasgow in 1972. In 2004, he joined LUT as Professor of Material Technology and Director of ASTRaL. His research career has been in the area of thin film deposition and since joining ASTRaL, his work has focused on ALD. He has also worked on molecular beam epitaxy, plasma chemical vapour deposition, magnetron sputtering, and sol-gel deposition.

Marja-Leena Kääriäinen has conducted ALD research for over 10 years. Her focus has been on the growth and structure of nanoscale metal oxide films. She has a particular interest in the photoactivity, photocatalytic activity, and antibacterial properties of ALD-grown thin films. Her background is in chemical engineering, which she studied at LUT and Michigan Technological University. Currently, she is a researcher at ASTRaL.

Arthur Sherman has 60 years of industrial experience, which includes almost 20 years with General Electric, seven years on the corporate staff of RCA, several years at Applied Materials, and six years at Varian Associates. He earned a master's degree in aeronautical engineering at Princeton University and a PhD at the University of Pennsylvania. He has published extensively, including approximately 50 research papers published in archive journals and three scientific monographs.

Dimensions (Overall): 9.3 Inches (H) x 6.1 Inches (W) x .9 Inches (D)
Weight: 1.25 Pounds
Suggested Age: 22 Years and Up
Number of Pages: 272
Genre: Technology
Sub-Genre: Materials Science
Publisher: Wiley-Scrivener
Theme: Thin Films, Surfaces & Interfaces
Format: Hardcover
Author: Tommi Kääriäinen & David Cameron & Marja-Leena Kääriäinen & Arthur Sherman
Language: English
Street Date: May 28, 2013
TCIN: 94488037
UPC: 9781118062777
Item Number (DPCI): 247-05-1132
Origin: Made in the USA or Imported
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Shipping details

Estimated ship dimensions: 0.9 inches length x 6.1 inches width x 9.3 inches height
Estimated ship weight: 1.25 pounds
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